成大材料系
TW
Journal papers

Journal papers

Journal papers

Search

Entry YearPlease go from low to high

to

Date of publication(Year/Month)Please go from low to high

to

Level

Keyword search

Search

Back

2018
SCI & EI
Extraction of sub-gap density of states via capacitance–voltage measurement for the erasing process in a TFT charge-trapping memory
AIP Advances
2018.2
陳貞夙
Yen-Chang Chiang;Yang-Hsuan Hsiao;Jeng-Ting Li;Jen-Sue Chen*
4
TOP